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Agilent ADS at 2008 IEEE EMC Symposium

Posted August 5th, 2008 · Please leave a comment · Conference

2008 Electromagnetic Compatibility Symposium

2008 Electromagnetic Compatibility Symposium © Detroit Metro Convention & Visitors Bureau

My colleague Mihai Marcu will be demo’ing jitter analysis using Agilent ADS at Booth 326-328 in the exhibit hall of 2008 IEEE Electromagnetic Compatibility (EMC) Symposium at the Cobo Center, Detroit, MI. The Symposium runs August 18 – 22, 2008, and the exhibition opens August 19th.

He’ll also be presenting two papers in the technical sessions:

  • “Estimation of Very Low BER Using Quasi-Analytical Method,” by D. Lu, S. Gupta, M. Marcu
  • “Duty-Cycle Distortion and Specifications for Test-Signal Generation,” by M. Marcu, S. Durbha, S. Gupta

Stop by the booth and say hello to Marcu. You might win a teeshirt or an Agilent multimeter!


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