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Power-aware Signal Integrity and EMI/EMC On High-speed Digital Chip-to-Chip Links

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Agilent Education Forum Videos Posted from DesignCon 2010

Posted June 8th, 2010 · 1 Comment · Video

If you came to our Agilent Education Forum at DesignCon 2010, thanks! If you missed it or (want to review it) you can register for access to the recordings here Practical Magic: Signal Integrity Problems Disappear with the Right Tools

Dr. Eric Bogatin Featuring:

  • Eric Bogatin, your host
  • Mike Resso, PLTS Grand Master
  • Brian Fetz, Infiniium Scope Expert
  • Sanjeev Gupta, ADS Guru

The segments are titled:
Introduction: High-Speed Digital Design and Using De-Embedding to Solve Signal Integrity Problems
Challenge #1: Measure component behavioral model
Challenge #2: Make launches disappear
Challenge #3: Measure signals where we want, not where we can
Challenge #4: Measure the de-embed file without SMAs
Challenge #5: Getting the de-embed file from layout
Challenge #6: Optimize drivers for open eyes
Challenge #7: FAST Integrated link analysis

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