Signal Integrity

Power-aware Signal Integrity and EMI/EMC On High-speed Digital Chip-to-Chip Links

Signal Integrity header image 4

Entries Tagged as 'device under test'

S-Parameter Bisection Using Optimization Techniques

November 12th, 2009 · 11 Comments · Application Note

Share
An optimization-based methodology to bisect an arbitrary set of S-parameters into two equal half using Agilent’s Advanced Design System (ADS).

[Read more →]

Tags: ·····