Signal Integrity

Power-aware Signal Integrity and EMI/EMC On High-speed Digital Chip-to-Chip Links

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Entries Tagged as 'DUT'

S-Parameter Bisection Using Optimization Techniques

November 12th, 2009 · 11 Comments · Application Note

An optimization-based methodology to bisect an arbitrary set of S-parameters into two equal half using Agilent’s Advanced Design System (ADS).

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